Volume 4, Issue 3, September 2018, Page: 26-34
Interaction of an Ultra-Short Laser Pulse and Ultra-Intense with a Dielectric
Oussama Boultif, PRIMALAB Laboratory, Department of Physics, Faculty of Material Sciences, University of Batna1, Batna, Algeria
Slimen Belghit, PRIMALAB Laboratory, Department of Physics, Faculty of Material Sciences, University of Batna1, Batna, Algeria
Beddiaf Zaidi, PRIMALAB Laboratory, Department of Physics, Faculty of Material Sciences, University of Batna1, Batna, Algeria
Abdelaziz Sid, PRIMALAB Laboratory, Department of Physics, Faculty of Material Sciences, University of Batna1, Batna, Algeria
Received: Sep. 6, 2018;       Accepted: Sep. 17, 2018;       Published: Nov. 7, 2018
DOI: 10.11648/j.ajn.20180403.11      View  77      Downloads  5
Abstract
In this work, we dedicated to the presentation of our results concerning the evolution of the electron density in the conduction band and the optical damage threshold (OBT). A study of the influence of the initial electronic density on the electron density in the conduction band and on the threshold of optical damage will also be presented. The main objective of this work is the theoretical study of optical damage of dielectric Materials like: Silicate by using a technique based on ultra-short and high-density laser pulses. The mains theoretical models about the OBT technique given in the literature are also studied. A new theoretical model with several improvements is proposed. This model takes into account the recombination’s mechanism with three holes. New numerical software has been developed in order to solve the PDE systems of our theoretical model using MATLAB simulation. The contribution of different mechanisms with OBT has been studied numerically. The obtained results showed that recombination mechanism with three holes plays an important role to estimate the density of free electrons and the OBT. We showed in our model that the recombination mechanisms reduce the electron density in the band of conduction is therefore increasing the threshold of optical damage (OBT). The predictions of the code developed in this study have been successfully compared to different experimental measurements of thresholds of breakdown in silica. The found results have a good agreement with experimental results.
Keywords
Dielectrics, Optical Breakdown Threshold, Ultra-Short Laser Pulse, Laser-Dielectric Interaction
To cite this article
Oussama Boultif, Slimen Belghit, Beddiaf Zaidi, Abdelaziz Sid, Interaction of an Ultra-Short Laser Pulse and Ultra-Intense with a Dielectric, American Journal of Nanosciences. Vol. 4, No. 3, 2018, pp. 26-34. doi: 10.11648/j.ajn.20180403.11
Copyright
Copyright © 2018 Authors retain the copyright of this article.
This article is an open access article distributed under the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/) which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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